PZT is widely used in the field of optical measurement for better linear characteristic, nanoscale resolution, quickly responding and precision in the process of microdisplacement. For the interfere measurements, PZT is applied to control the movement of mirror and introduce the controllable phase shift, thus it is required to know the characteristic of PZT between voltage and phase. A measurement method of PZT phase shift characteristic based on interference fringe correlation coefficient was presented in this paper. The interference fringe pattern was captured by CMOS digital cameras capture. The normalized correlation coefficient was calculated by 0 voltage corresponding pattern as a benchmark figure, and the PZT voltage phase shift characteristic curve was drawn to realize the phase control in interfere measurement.